Advanced Production Testing of RF, SoC, and SiP Devices
| Author | : | |
| Rating | : | 4.43 (920 Votes) |
| Asin | : | 158053709X |
| Format Type | : | paperback |
| Number of Pages | : | 326 Pages |
| Publish Date | : | 2015-06-29 |
| Language | : | English |
DESCRIPTION:
. About the Author Joe Kelly is a Wireless Center of Expertise senior RF technical consultant at Agilent Technologies. He is also the coauthor of Production Testing of RF and System-on-a-Chip Devices (Artech House, 2004) and a frequent presenter at international conferences and workshops. Engelhardt has written several papers for major international conferences. in electrical engineering from the University of Ulm, Germany and an M.B.A. He holds an M.S. Engelhardt is a senior RF applications engineer at Agilent Technologies. from the University of Dallas. Michael D. Kelly earned his Ph.D. Mr. Dr. at Rutgers University
The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before.
He holds an M.S. Joe Kelly is a Wireless Center of Expertise senior RF technical consultant at Agilent Technologies. from the University of Dallas. Kelly earned his Ph.D. in electrical engineering from the University of Ulm, Germany and an M.B.A. He is also the coauthor of Production Testing of RF and Sys