Transmission Electron Microscopy and Diffractometry of Materials

Read [Brent Fultz, James Howe Book] ^ Transmission Electron Microscopy and Diffractometry of Materials Online # PDF eBook or Kindle ePUB free. Transmission Electron Microscopy and Diffractometry of Materials The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. Num

Transmission Electron Microscopy and Diffractometry of Materials

Author :
Rating : 4.97 (601 Votes)
Asin : 3540437649
Format Type : paperback
Number of Pages : 770 Pages
Publish Date : 2017-04-02
Language : English

DESCRIPTION:

M. The book can be highly recommended … ." (W. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. "I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques."(John Hutchison in Journal of Microscopy)"I c

The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials

"Excellent TEM book" according to Joseph Feser. This is now my go-to source for TEM information. Its very readable, yet has loads of information about the specific modes and analysis of TEM data. Its a good book to learn from and a pretty good reference.. wrote by TEM expert book reviewer This book is concise and comprehensive. Own it if you want to master TEM.

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